Acknowledgements
In the “Acknowledgements” section of peer-reviewed publications and technical reports, the following sentence should be incorporated:
The authors acknowledge the use of the instruments and scientific and technical assistance at the Centre of Electron Microscopy and Materials Science, The University of Auckland, Auckland, New Zealand.
Referencing Instrumentation
When the Centre of Electron Microscopy and Materials Science has provided a service, the following examples should be used in the body text of peer-reviewed publications (for example, in the Experimental Procedure, Methods and Materials or Results sections):
- Scanning electron microscopy was carried out using a Zeiss Gemini 460 SEM.
- Scanning electron microscopy was performed using a Zeiss Crossbeam 350 SEM.
- Focused ion beam (FIB) milling was carried out using a Zeiss Crossbeam 350 FIB-SEM
- A Zeiss Gemini 460 SEM/Zeiss Crossbeam 350 SEM, equipped with an Oxford Instruments ULTIM MAX 100 EDS detector, was used for scanning electron microscopy (SEM) and Energy Dispersive Spectroscopy (EDS).
- A Zeiss Gemini 460 SEM/Zeiss Crossbeam 350 SEM, equipped with an Oxford Instruments ULTIM MAX 100 EDS detector, and an Oxford Instruments SYMETRY S3 EBSD detector, was used for scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), and Electron backscatter diffraction (EBSD).
Where significant sample preparation was required that warrants inclusion in the text, please refer to the information on the instrument-specific pages on this site, or talk with the relevant technical staff.
In cases where significant intellectual contributions have been made, co-authorship may be appropriate, following usually accepted scientific practice.
Publications
Please send a link to any publications that have utilised CEMMS instrumentation to cemms@auckland.ac.nz