Instruments

Equipment at the Centre for Electron Microscopy and Materials Science (CEMMS) allows for topographical imaging (secondary electron and back scatter electron imaging), elemental analysis, and crystal orientation mapping by electron diffraction. We are always working to improve our facilities and offer access to new characterization techniques. If you are interested in collaborating into the acquisition of a new equipment, please contact the CEMMS director.
For more details on our equipment and and their capabilities, please choose from the list below: